Supplier Registration notice for upcoming Tender - FIB SEM and SEM Microscopes (WS1574331614)

⁠⁠⁠The University is looking to purchase a Focused Ion Beam Scanning Electron Microscope (FIB SEM) and a Scanning Electron Microscope (SEM) which are required for Sydney Microscopy and Microanalysis (SMM) Core Research Facility (CRF) to support the new Engineering Microscopy node in the Engineering Precinct. This specialized equipment will be used to support many research initiatives and researchers.

Some mandatory requirements of this tender are:

1. Participant must have an existing installed base of FIB SEM's and SEM's within Australia.

2. Participant must have existing trained support engineers and service department located within Sydney.

3. Participant must have demonstration systems available in Korea or Japan for imaging tests during mid October timeframe.

4. The equipment must be capable of;

a) imaging beam sensitivity or non-conductive samples without variable pressure or stage biasing at resolutions of 1.5nm or better.

b) integrated micromanipulator system capable of performing TEM/APT lamella extraction and rotation, controlled from the UI on the FIB.

c) producing high electron beam currents (100nA or greater) while maintaining a small probe size to push the resolution limit for techniques like ECCI, TKD and EBSD and to provide the speed for imaging and analytical techniques during in-situ microscopy.

d) Able to deliver 100nA or more ion beam current to the sample and produce clean side wall cuts at these currents into a variety of materials including, metals, ceramics, and biomaterials.

PROJECT TIMING

The tender will be released in the second half of August 2023 and be on open for 3 weeks

ELIGIBILITY TO TENDER

IF YOU MEET ALL THE MANDATORY REQUIREMENTS LISTED ABOVE AND ARE INTERESTED IN REGISTERING FOR THIS TENDER, PLEASE FOLLOW THE SUPPLIER REGISTRATION GUIDENCE ATTACHED TO THIs NOTICE.